The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Jun. 25, 2008
Applicant:
Haw Chong Soon, Widnau, CH;
Inventor:
Haw Chong Soon, Widnau, CH;
Assignee:
Leica Instruments (Singapore) Pte. Ltd, Singapore, SG;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope comprising a main objective having a variable focal length and comprising an illuminating unit including a light source and an illuminating optical system for generating an illuminating beam path directed onto the object plane and extending outside the main objective. A unit is provided for centering the illumination dependent on a variation of the focal length of the main objective. The illuminating optical system is mounted at least in part in a laterally shiftable manner for centering the illumination.