The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
May. 25, 2009
Kai N Lafortune, Livermore, CA (US);
Randall Hurd, Tracy, CA (US);
Scott N Fochs, Livermore, CA (US);
Mark D Rotter, San Ramon, CA (US);
Lloyd Hackel, Livermore, CA (US);
Kai N LaFortune, Livermore, CA (US);
Randall Hurd, Tracy, CA (US);
Scott N Fochs, Livermore, CA (US);
Mark D Rotter, San Ramon, CA (US);
Lloyd Hackel, Livermore, CA (US);
Lawrence Livermore National Security, LLC, Livermore, CA (US);
Abstract
Wavefront control techniques are provided for the alignment and performance optimization of optical devices. A Shack-Hartmann wavefront sensor can be used to measure the wavefront distortion and a control system generates feedback error signal to optics inside the device to correct the wavefront. The system can be calibrated with a low-average-power probe laser. An optical element is provided to couple the optical device to a diagnostic/control package in a way that optimizes both the output power of the optical device and the coupling of the probe light into the diagnostics.