The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2011

Filed:

Sep. 28, 2007
Applicants:

Mathias Hörnig, Erlangen, DE;

Thomas Mertelmeier, Erlangen, DE;

Phillip Thaler, Erlangen, DE;

Inventors:

Mathias Hörnig, Erlangen, DE;

Thomas Mertelmeier, Erlangen, DE;

Phillip Thaler, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 17/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method and system for monitoring the power state of an x-ray emitter and/or an x-ray detector, the x-ray emitter is operated according to a set of test parameters, so as to emit x-rays that strike at least a portion of the detector region of the x-ray detector. At least one value characterizing the operation of the x-ray emitter and/or the x-ray detector is determined, and this detected parameter is compared with a comparable reference parameter value. The power state of the x-ray emitter and/or the x-ray detector is determined based on deviation of the detected parameter from the reference parameter.


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