The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
May. 24, 2007
Ezra Baruch, Karkur, IL;
Dan Kuzmin, Givat-Shmuel, IL;
Michael Priel, Hertzlya, IL;
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method for testing an integrated circuit, that includes: (a) providing a first signal to a first path that starts within the integrated circuit and ends at a first memory element that is followed by a first IO pad, and providing a second signal to a second path that starts within the integrated circuit and ends at a second memory element that is followed by a second IO pad; (b) comparing between a first test result and a second test result, wherein the first test result represents a state of the first memory element sampled a predefined period after a provision of the first signal and the second test result represents a state of the second memory element sampled a predefined period after a provision of the second signal; (c) altering the predefined period; and (d) repeating the stages of providing, comparing and altering until detecting a time difference between a first path propagation period and a second path propagation period.