The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Dec. 16, 2008
Applicant:
Changhe Shang, Fremont, CA (US);
Inventor:
Changhe Shang, Fremont, CA (US);
Assignee:
Western Digital (Fremont), LLC, Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of testing Pstiffness of a magnetoresistance (MR) sensor stack including a Ppinned layer is provided. The method comprises the step of applying an external magnetic field to the MR sensor stack. The external magnetic field is oriented substantially perpendicular to a magnetic field of the Ppinned layer. The method further comprises varying an amplitude of the external magnetic field, measuring a change in a resistance of the MR sensor stack in response to the varying amplitude of the external magnetic field, and calculating the Pstiffness based on the measured change in resistance.