The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Dec. 29, 2008
John C. Berends, Jr., Bel Air, MD (US);
Timothy P. Karpetsky, Towson, MD (US);
Ross C. Willoughby, Pittsburgh, PA (US);
Edward W. Sheehan, Pittsburgh, PA (US);
John C. Berends, Jr., Bel Air, MD (US);
Timothy P. Karpetsky, Towson, MD (US);
Ross C. Willoughby, Pittsburgh, PA (US);
Edward W. Sheehan, Pittsburgh, PA (US);
Science Applications International Corporation, San Diego, CA (US);
Abstract
Ions carried in a flowing gas stream are transferred to another gas stream of different composition or purity through an ion selective aperture communicating between the gas streams. The ion selective aperture is formed of a central layer which has an electrically conductive layer on each of its surfaces. One or more open channels extend through the central layer and surface layers allowing physical movement of ions therethrough under the urging and influence of an electric field created by imposing a voltage differential between the conductive surface layers of the ion selective aperture. The gas flow rates of the different gas streams may be independently varied to allow adjustment of ion concentration and flow rate to meet the needs of the ion destination. This device can control sample ion introduction into gas-phase ion detectors, such as ion mobility analyzers, differential mobility analyzers, mass spectrometers, and combinations thereof.