The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Oct. 14, 2009
Ajay Paidi, Pleasant Hill, CA (US);
Jonathan S. Maltz, Oakland, CA (US);
Supratik Bose, Walnut Creek, CA (US);
Ajay Paidi, Pleasant Hill, CA (US);
Jonathan S. Maltz, Oakland, CA (US);
Supratik Bose, Walnut Creek, CA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Some embodiments include determination of a first projection image of a phantom based on first imaging geometry parameters associated with a first radiation-based imaging system and on a virtual model of the phantom, acquisition of a second projection image of the phantom based on radiation emitted from the first radiation-based imaging system, the phantom located at a first position and determination of a difference between the first projection image and the second projection image. Second imaging geometry parameters are determined based on the first imaging geometry parameters and the difference between the first projection image and the second projection image, a third projection image of the phantom is determined based on the second imaging geometry parameters and on the virtual model of the phantom, and a fourth projection image of the phantom located at the first position is acquired based on radiation emitted from the first radiation-based imaging system. A difference between the third projection image and the fourth projection image is determined and it is determined that the difference between the third projection image and the fourth projection image is less than a threshold.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile