The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Jun. 08, 2010
Ulrich Sander, Rebstein, CH;
Manfred Kuster, Widnau, CH;
Ulrich Sander, Rebstein, CH;
Manfred Kuster, Widnau, CH;
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Abstract
The present invention relates to an illuminating apparatus for an operating microscope comprising two observation beam paths () for a first observer (main surgeon) and two observation beam paths () for a second observer (assisting surgeon), comprising an illuminating system () and deflecting means (), for deflecting light emanating from the illumination system onto an object () that is to be observed, wherein the deflecting device comprises a first deflecting element () which is associated with a first observation beam path () of the first observer and a first observation beam path () of the second observer, and a second deflecting element () which is associated with a second observation beam path () of the first observer and a second observation beam path () of the second observer.