The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Aug. 01, 2007
Applicants:
Yuri Evgenievich Korchev, London, GB;
Max Joseph Lab, London, GB;
Daniel Paulo Sànchez-herrera, London, GB;
Inventors:
Yuri Evgenievich Korchev, London, GB;
Max Joseph Lab, London, GB;
Daniel Paulo Sànchez-Herrera, London, GB;
Assignee:
Ionscope Ltd, London, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01); H01L 21/306 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for interrogating a surface using scanning probe microscopy comprises bringing a scanning probe into proximity with the surface and controlling the position of the probe relative to the surface to maintain a constant distance, characterized in that pressure is applied to the surface by a regulated flow of liquid through the probe, with subsequent monitoring of the position of the probe, wherein movement of the probe indicates a consequent movement of the surface.