The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Sep. 24, 2008
Terrence Chen, Princeton, NJ (US);
Chao Yuan, Secaucus, NJ (US);
Abdul Saboor Sheikh, Pittsburgh, PA (US);
Claus Neubauer, Monmouth Junction, NJ (US);
Terrence Chen, Princeton, NJ (US);
Chao Yuan, Secaucus, NJ (US);
Abdul Saboor Sheikh, Pittsburgh, PA (US);
Claus Neubauer, Monmouth Junction, NJ (US);
Siemens Corporation, Iselin, NJ (US);
Abstract
A method and framework are described for detecting changes in a multivariate data stream. A training set is formed by sampling time windows in a data stream containing data reflecting normal conditions. A histogram is created to summarize each window of data, and data within the histograms are clustered to form test distribution representatives to minimize the bulk of training data. Test data is then summarized using histograms representing time windows of data and data within the test histograms are clustered. The test histograms are compared to the training histograms using nearest neighbor techniques on the clustered data. Distances from the test histograms to the test distribution representatives are compared to a threshold to identify anomalies.