The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8005712 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 23, 2011

Filed:

Apr. 06, 2007
Applicants:

Matthias Von Davier, Lawrenceville, NJ (US);

Xueli Xu, Chicago, IL (US);

Kentaro Yamamoto, Lawrenceville, NJ (US);

Inventors:

Matthias von Davier, Lawrenceville, NJ (US);

Xueli Xu, Chicago, IL (US);

Kentaro Yamamoto, Lawrenceville, NJ (US);

Assignee:

Educational Testing Service, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein is a method of analyzing large scale survey results comprising obtaining a sparse data set representing a subset of an original data set comprising a plurality of individuals' responses to a plurality of questions, wherein the sparse data set comprises less than ninety percent of the responses in the original data set; analyzing the sparse data set using a general diagnostic model; and obtaining estimated person parameters using the general diagnostic model.


Find Patent Forward Citations

von Davier, Matthias. (2011). System and method for large scale survey analysis (U.S. Patent No. 8005712). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8005712

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…