The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Feb. 20, 2009
R. Charles Evans, Overland Park, KS (US);
Brian E. Hayward, Lawrence, KS (US);
Shaun M. Johnson, Kansas City, MO (US);
Justin A. Martin, Olathe, KS (US);
Brian J. Washburn, Kansas City, MO (US);
R. Charles Evans, Overland Park, KS (US);
Brian E. Hayward, Lawrence, KS (US);
Shaun M. Johnson, Kansas City, MO (US);
Justin A. Martin, Olathe, KS (US);
Brian J. Washburn, Kansas City, MO (US);
Sprint Communications Company L.P., Overland Park, KS (US);
Abstract
A system provides network application transaction analysis. An analysis tool, when executed by a processor, measures an application transaction metric and calculates a historical system average and a historical application average associated with the application transaction metric based on server performance logs. The tool determines whether the application transaction metric differs from the historical system average by more than a first threshold amount during consecutive measurements. The tool determines whether the application transaction metric differs from the historical application average by more than a second threshold amount during consecutive measurements if the application transaction metric does not differ from the historical system average by more than the first threshold amount during consecutive measurements. The tool outputs an alarm to a user interface to enable a generation of an investigation if the application transaction metric differs from the historical application average by more than the second threshold amount during consecutive measurements.