The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Dec. 11, 2006
William Ortyn, Bainbridge Island, WA (US);
David Basiji, Seattle, WA (US);
Keith Frost, Seattle, WA (US);
Luchuan Liang, Woodinville, WA (US);
Richard Bauer, Kirkland, WA (US);
Brian Hall, Seattle, WA (US);
David Perry, Woodinville, WA (US);
William Ortyn, Bainbridge Island, WA (US);
David Basiji, Seattle, WA (US);
Keith Frost, Seattle, WA (US);
Luchuan Liang, Woodinville, WA (US);
Richard Bauer, Kirkland, WA (US);
Brian Hall, Seattle, WA (US);
David Perry, Woodinville, WA (US);
Amnis Corporation, Seattle, WA (US);
Abstract
A high speed, high-resolution flow imaging system is modified to achieve extended depth of field imaging. An optical distortion element is introduced into the flow imaging system. Light from an object, such as a cell, is distorted by the distortion element, such that a point spread function (PSF) of the imaging system is invariant across an extended depth of field. The distorted light is spectrally dispersed, and the dispersed light is used to simultaneously generate a plurality of images. The images are detected, and image processing is used to enhance the detected images by compensating for the distortion, to achieve extended depth of field images of the object. The post image processing preferably involves de-convolution, and requires knowledge of the PSF of the imaging system, as modified by the optical distortion element.