The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2011

Filed:

May. 30, 2008
Applicant:

Francois Leitner, Uriage, FR;

Inventor:

Francois Leitner, Uriage, FR;

Assignee:

Aesculap AG, Tuttlingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 17/56 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and device for preparing an implant from an implant material are provided. A defect image of the defect which has a defect contour is made available, in which a first calibration member arranged in or adjacent to the defect is displayed. A second calibration member is arranged on or adjacent to the implant material to be processed, this second calibration member corresponding to the first calibration member. A real-time image of the implant material is displayed on a display device. The defect image is displayed on the display device and superimposed on the real-time image so that the first and the second calibration members are displayed one on top of the other. A processing tool is displayed on the display device in the real-time image and moved over the implant material so that it follows the defect contour displayed in the defect image.


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