The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Nov. 01, 2006
Prashant Darisi, Nashua, NH (US);
Jeremy Spilman, Shirley, MA (US);
Jose Graziani, Shrewsbury, MA (US);
Prashant Darisi, Nashua, NH (US);
Jeremy Spilman, Shirley, MA (US);
Jose Graziani, Shrewsbury, MA (US);
Azimuth Systems, Inc., Acton, MA (US);
Abstract
A method and apparatus is provided that enables accurate measurement of drop rate and delay in a System Under Test (SUT) by one or more monitoring devices even when the frame error rate of the monitoring devices may be imperfect. During a packet drop measurement process, ancillary information is identified and analyzed to determine if the ancillary information can be used to infer receipt of packets when explicit information regarding receipt is not present. A delay measurement process incorporates the time required to re-transmit packets into the delay measurement to more accurately reflect SUT operation.