The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Nov. 20, 2006
Sadao Mizuno, Osaka, JP;
Sadao Mizuno, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A diffraction grating is constituted such that directions of diffraction are disposed asymmetrically with respect to the optical axis, by causing light subjected to aperture restriction to have a difference of one half wavelength in the optical path length by making use of the fact that the difference in the optical path length experienced by the light passing through a diffraction element varies depending on the wavelength. With this constitution of the diffraction grating, aperture restriction is applied to both the light focused on an optical disk and the light reflected from the optical disk, thereby achieving an optical pickup that is capable of recording/reproducing information on/from optical disks of different types by using a single objective lens. The optical pickup prevents unnecessary light from entering a photodetector and enables the production of diffraction elements at a low cost.