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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8004676 B1

PDFFull Text
Expired
Date of Patent:
Aug. 23, 2011

Filed:

Feb. 11, 2008

Method for detecting analytes using surface plasmon resonance

Applicants:

Paras N. Prasad, Williamsville, NY (US);

Przemyslaw P. Markowicz, Woodbury, MN (US);

Wing Cheung Law, Amherst, NY (US);

Andrei Kabashin, St.-Leonard, CA;

Sergiy Patskovsky, Montreal, CA;

Inventors:

Paras N. Prasad, Williamsville, NY (US);

Przemyslaw P. Markowicz, Woodbury, MN (US);

Wing Cheung Law, Amherst, NY (US);

Andrei Kabashin, St.-Leonard, CA;

Sergiy Patskovsky, Montreal, CA;

Assignee:

The Research Foundation of State University of New York, Amherst, NY (US);

Attorney:

Hodgson Russ LLP

Primary Examiner:

Patrick J Connolly

Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided for detection of analytes using the Surface Plasmon Resonance effect. The method comprises providing a metal film on a transparent substrate. The free surface of the metal film is exposed to a test sample. An anlyte in the sample can interact directly with the metal film or via analyte binding molecules (ABMs) complexed to the film. Light is directed incident to the surface of film in contact with the substrate. Light is reflected from the surface of the film under SPR conditions. The reflected light is collected and the second and/or third harmonics of the resulting electrical signal, which are indicative of the phase and polarization state of the reflected light, are determined. The second and third harmonics are correlated to the presence and/or concentration of the analyte.

Find Patent Forward Citations

Prasad, Paras. (2011). Method for detecting analytes using surface plasmon resonance (U.S. Patent No. 8004676). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8004676

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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