The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Jul. 19, 2006
Gary B. Hughes, Santa Maria, CA (US);
Gary B. Hughes, Santa Maria, CA (US);
Flir Systems, Inc., Wilsonville, OR (US);
Abstract
Systems and methods are disclosed herein to provide automated testing on infrared image data to detect image quality defects. For example, in accordance with an embodiment of the present invention, image processing algorithms are disclosed to generate an image quality metric that may be compared to one or more thresholds to perform an automated test for image quality defects. For example, the image quality metric may be compared to two thresholds to determine if the corresponding infrared sensor or infrared camera is defective or not due to image quality or requires further manual inspection by test personnel.
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