The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2011

Filed:

Mar. 19, 2010
Applicants:

Hsing-chien Roy Liu, Cupertino, CA (US);

Wai Cheong Chan, Sunnyvale, CA (US);

Inventors:

Hsing-Chien Roy Liu, Cupertino, CA (US);

Wai Cheong Chan, Sunnyvale, CA (US);

Assignee:

National Semiconductor Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus includes a delay line having multiple delay cells coupled in series. The delay line is configured to receive an input signal and to propagate the input signal through the delay cells. The apparatus also includes multiple sampling circuits configured to sample the input signal at different taps in the delay line and to output sampled values. The delay line has (i) a finer resolution closer to a target tap and (ii) a coarser resolution farther away from the target tap on each side of the target tap. For example, taps nearer the target tap can be closer to each other in order to support the finer resolution, and taps farther from the target tap can be farther apart from each other in order to support the coarser resolution. The apparatus can further include an encoder configured to encode the sampled values in order to generate an encoded value.


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