The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2011

Filed:

Jun. 01, 2006
Applicants:

Edmund S R Sikora, Ipswich, GB;

Peter Healey, Ipswich, GB;

Inventors:

Edmund S R Sikora, Ipswich, GB;

Peter Healey, Ipswich, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method of and apparatus for evaluating the position of a disturbance, in particular using a waveguide having a plurality of overlap regions. A position sensor is provided including: an optical waveguide; a transmission stage for launching a sensing signal into the waveguide; a receiving stage arranged to receive a returned sensing signals which returned sensing signal is a time distributed signal derived from backscattered components of the sensing signal, the waveguide being arranged along a path having a plurality of overlap regions such that a disturbance in an overlap region causes a first disturbance feature and a second disturbance feature in the returned sensing signal; and, monitoring means for monitoring the returned signal, such that a respective time of return can be associated with the first and second disturbance feature. Both return features can then be used to evaluate the position of the disturbance so as to enhance the resolution of the position sensor.


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