The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2011

Filed:

Jan. 11, 2005
Applicants:

Snehal Chandrakant Shah, Milwaukee, WI (US);

Steven Charles Miller, Waukesha, WI (US);

Michael Richard Moritz, Brookfield, WI (US);

Inventors:

Snehal Chandrakant Shah, Milwaukee, WI (US);

Steven Charles Miller, Waukesha, WI (US);

Michael Richard Moritz, Brookfield, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A beamformer for an ultrasound system and a method for developing a beamformer are provided. The beamformer includes an RF interface configured to be connected to receiver boards that are connected to a probe. The method includes providing receiver boards, wherein each of the receiver boards is capable of conveying a common number of channels per board and has substantially similar circuit components and layouts. The method also includes selecting a number of channels per probe to be conveyed in parallel between a probe and the receiver boards, wherein the channels per probe is an integer multiple of the channels per board. The method further includes determining a combination of the receiver boards to use in the beamformer based on the number of channels per probe, wherein the receiver boards are capable of being used in at least first and second different combinations that support first and second different numbers of channels per probe.


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