The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2011

Filed:

Nov. 30, 2005
Applicants:

Robert E. Blake, Woodbury Heights, NJ (US);

Donald T. Hudrick, Sicklerville, NJ (US);

Inventors:

Robert E. Blake, Woodbury Heights, NJ (US);

Donald T. Hudrick, Sicklerville, NJ (US);

Assignee:

Metrologic Instruments, Inc., Blackwood, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanner flipper integrity checking method, computer-readable medium, and apparatus is provided. In one embodiment, the method powers a motor for a predetermined amount of time. After the predetermined time has expired a wave is received indicative of the frequency of the oscillation of the flipper. Thereafter, the method uses the wave signal to determine whether there are two consecutive transitions indicative of movement by said flipper. In another embodiment, an apparatus is also provided which performs the similar features recited by the above method.


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