The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8001492 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 16, 2011

Filed:

Jun. 27, 2008
Applicant:

Wallace W. Lin, San Jose, CA (US);

Inventor:

Wallace W. Lin, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A design and evaluation method for interconnect wires of integrated circuits is provided to detect, analyze and predict response of interconnect layout to integrated-circuit manufacture processes.


Find Patent Forward Citations

Lin, Wallace. (2011). Evaluation method for interconnects interacted with integrated-circuit manufacture (U.S. Patent No. 8001492). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8001492

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…