The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Jun. 05, 2006
Yixin Diao, White Plains, NY (US);
Robert Filepp, Westport, CT (US);
Robert D. Kearney, Yorktown Heights, NY (US);
Alexander Keller, New York, NY (US);
Yixin Diao, White Plains, NY (US);
Robert Filepp, Westport, CT (US);
Robert D. Kearney, Yorktown Heights, NY (US);
Alexander Keller, New York, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The invention broadly and generally provides a method for calibrating the relationship between management-inherent complexity metrics deriving from the management structure and human perceived complexity of information technology management comprising: (a) obtaining a set of management-inherent complexity metrics; (b) obtaining a set of human-perceived complexity metrics; (c) constructing a control model identifying a set of dominant indicators selected from the aforesaid set of management-inherent complexity metrics; (d) establishing a value model mapping from the aforesaid set of dominant indicators to the aforesaid set of human-perceived complexity metrics.