The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8000935 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 16, 2011

Filed:

May. 27, 2009
Applicant:

Lyndon R. Logan, Hopewell Junction, NY (US);

Inventor:

Lyndon R. Logan, Hopewell Junction, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diagnostic method of and computer system for root-cause analysis of performance variations of FETs in integrated circuits and a method and computer system for monitoring a field effect transistor manufacturing process. The diagnostic method includes measuring source currents in the linear and saturated regions of two FETs, calculating ratios of the source currents in the linear and saturated regions for the and two FETs and comparing the ratios of the two FETs to determine a probable root cause for a performance variation between the two FETs. One of the FETs has a known good performance.


Find Patent Forward Citations

Logan, Lyndon. (2011). Diagnostic method for root-cause analysis of fet performance variation (U.S. Patent No. 8000935). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8000935

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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