The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Aug. 28, 2008
Yury Bakshi, Morganville, NJ (US);
David Arthur Hoeflin, Middletown, NJ (US);
Yury Bakshi, Morganville, NJ (US);
David Arthur Hoeflin, Middletown, NJ (US);
AT&T Intellectual Property I, L.P., Atlanta, GA (US);
Abstract
Disclosed are method and apparatus for calculating a quantile estimate of a data stream. A quantile estimate is calculated iteratively by calculating a first quantile estimate and then calculating a second quantile estimate by adding a first update increment to the first estimate. A first observation sample is acquired. A first quantile estimate and a first standard deviation estimate are set to the sample quantile and the sample standard deviation of the first observation sample. A second observation sample is then acquired. A second standard deviation estimate is calculated based at least in part on the first standard deviation estimate and the sample standard deviation of the second observation sample. A first update increment is calculated based at least in part on the second observation sample and based at least in part on the product of the second standard deviation estimate times a log odds ratio function.