The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Feb. 25, 2009
Shinichirou Hanawa, Yokohama, JP;
Isao Nakamura, Kawasaki, JP;
Akiko Tadokoro, Kamakura, JP;
Atsunori Hotehama, Toride, JP;
Yukiko Yamamoto, Yokohama, JP;
Haruo Umeki, Tokyo, JP;
Akihiro Kondo, Ichikawa, JP;
Youichi Hamamoto, Tokyo, JP;
Kouichi Hiraoka, Moriya, JP;
Shinichirou Hanawa, Yokohama, JP;
Isao Nakamura, Kawasaki, JP;
Akiko Tadokoro, Kamakura, JP;
Atsunori Hotehama, Toride, JP;
Yukiko Yamamoto, Yokohama, JP;
Haruo Umeki, Tokyo, JP;
Akihiro Kondo, Ichikawa, JP;
Youichi Hamamoto, Tokyo, JP;
Kouichi Hiraoka, Moriya, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference value as optimum parameters, and a regression equation calculating part that calculates and displays a regression equation when employing the optimum parameters with the multiple regression analysis program.