The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2011

Filed:

Dec. 19, 2006
Applicants:

Qingzhong Jiao, Fremont, CA (US);

Wen Zhao, Cupertino, CA (US);

Isabel Mahe, Los Altos, CA (US);

Inventors:

Qingzhong Jiao, Fremont, CA (US);

Wen Zhao, Cupertino, CA (US);

Isabel Mahe, Los Altos, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various embodiments for performing calibration of a mobile computing device are described. In one or more embodiments, a device under test and a calibration test bench may be coupled by at least one of a wireless connection and a wired connection. The device under test may be arranged to receive one or more test command instructions from the calibration test bench and, in response, send an acknowledgment to the calibration test bench. In some embodiments, the device under test and the calibration test bench may be arranged to communicate according to a wireless device calibration protocol. Other embodiments are described and claimed.


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