The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2011

Filed:

Sep. 21, 2007
Applicants:

Hui Zhang, Yongin-si, KR;

Keun-ho Kim, Seoul, KR;

Do-kyoon Kim, Seongnam-si, KR;

Inventors:

Hui Zhang, Yongin-si, KR;

Keun-Ho Kim, Seoul, KR;

Do-kyoon Kim, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are an apparatus, method, and medium for processing an image. In the apparatus, at least one image selected from images to be stitched so as to make colors of overlapped sections of the images as identical with each other as possible and operating again in response to a re-alignment signal, and an image correction unit generating the re-alignment signal after correcting a color of at least a part of the overlapped sections as a result of the shifting of the at least one image in consideration of colors of the overlapped sections Then the shifting of the image is repeated. Therefore, even when the overlapped sections of the images are not identical in color, the overlapped sections of the images can be precisely aligned when the images are stitched for forming a panoramic image, thereby making the panoramic image more accurate.


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