The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
May. 15, 2008
Jian-feng LI, Hangzhou, CN;
Cheng-jian He, Hangzhou, CN;
Jin Wang, Hangzhou, CN;
ArcSoft, Inc., Fremont, CA (US);
Abstract
A method for estimating noise according to a multiresolution model is applied to an imaging device and comprises steps of: using an imaging sensor of the imaging device to capture a series of images of a scene under different imaging conditions; processing the images with a multiresolution transformation process to obtain a series of sub-images corresponding to different frequency layers; processing a series of the sub-images of the images that are in a same frequency layer to generate an averaged image; determining a difference between each of the sub-images in the same frequency layer and the averaged image corresponding to that frequency layer, and calculating the differences and the averaged image to obtain noise level functions of the imaging sensor in the different frequency layers under the different imaging conditions; and defining the noise level functions of the imaging sensor as noise samples for establishing an a priori model database.