The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Nov. 28, 2007
Chia-lun Chang, Sunnyvale, CA (US);
Chih-huei Wu, San Jose, CA (US);
John T. Yue, Los Altos, CA (US);
Chia-Lun Chang, Sunnyvale, CA (US);
Chih-huei Wu, San Jose, CA (US);
John T. Yue, Los Altos, CA (US);
OmniVision Technologies, Inc., Santa Clara, CA (US);
Abstract
An image sensor testing apparatus is disclosed. The image sensor testing apparatus includes an electronic test system having a light source for illuminating an image sensor wafer to generate pixel data and a host processor for receiving the pixel data. An interface card coupled to the electronic test system has a programmable processor for processing the pixel data to generate processed data, the processed data transmitted to and analyzed by the host processor together with the pixel data to detect pixel defects in the image sensor wafer.