The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Nov. 06, 2007
Chan Kyu Park, Daejeon, KR;
Joo Chan Sohn, Daejeon, KR;
Hyun Kyu Cho, Daejeon, KR;
Young JO Cho, Kyungki-do, KR;
Chan Kyu Park, Daejeon, KR;
Joo Chan Sohn, Daejeon, KR;
Hyun Kyu Cho, Daejeon, KR;
Young Jo Cho, Kyungki-do, KR;
Abstract
A system and method for analyzing the motions of an object based on the silhouettes of the object are provided. The system includes a foreground detector, a contour extractor, a model generator, a corner histogram generator, and a value of similarity measuring unit. The foreground detector detects a moving foreground object from an input image. The contour extractor extracts silhouette contour of the detected foreground object, and the model generator generates mean value histogram models as references to determine motions of the object. The corner histogram generator generates corner histograms of hierarchical multiband in the extracted contour signal, and the value of similarity measuring unit calculates a value of similarity between the generated corner histogram of a current frame and the average model histogram in a histogram unit, measures a value making a value of similarity with the calculated current frame histogram maximum, and determines the measured value as a posture of the object in the current frame.