The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2011

Filed:

Apr. 07, 2008
Applicants:

Edward J. Seppi, Portola Valley, CA (US);

John Ford, Madison, TN (US);

Marcel Marc, San Jose, CA (US);

Inventors:

Edward J. Seppi, Portola Valley, CA (US);

John Ford, Madison, TN (US);

Marcel Marc, San Jose, CA (US);

Assignee:

Varian Medical Systems, Inc., Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning unit for inspecting objects comprises in one example a radiation source, a movable platform to support an object, and a detector positioned to receive radiation after interaction of radiation with the object. The platform is movable at least partially within a cavity defined, at least partially, below at least one of the source or the detector. In another scanning unit, a first conveyor conveys an object to a movable platform, and second and third conveyors convey the object from the platform. The second and third conveyors are at different vertical heights. In another scanning unit, images from an energy sensitive detector and a spatial detector are fused. In a method, scanning parameters during CT scanning are changed and images reconstructed before and after the change. In another method, an object is scanned with X-ray beams having first and second energy distributions, generated by the same X-ray source.


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