The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
May. 19, 2006
Michiaki Shinotsuka, Kanagawa, JP;
Masaru Shinkai, Kanagawa, JP;
Hiroyoshi Sekiguchi, Kanagawa, JP;
Eiko Hibino, Kanagawa, JP;
Masaki Kato, Kanagawa, JP;
Katsuyuki Yamada, Kanagawa, JP;
Masahiko Nakayama, Kanagawa, JP;
Michiaki Shinotsuka, Kanagawa, JP;
Masaru Shinkai, Kanagawa, JP;
Hiroyoshi Sekiguchi, Kanagawa, JP;
Eiko Hibino, Kanagawa, JP;
Masaki Kato, Kanagawa, JP;
Katsuyuki Yamada, Kanagawa, JP;
Masahiko Nakayama, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A dual-layer structure phase-change type optical recording medium includes a substrate (), a reflective layer (), a first protective layer (), a first recording layer (), a second protective layer (), a resin intermediate layer (), a third protective layer (), a heat release layer () made of Cu or a Cu alloy, a fourth protective layer (), a second recording layer (), a fifth protective layer () and a cover substrate (). A product of a reflectance of a high-reflection part and a modulation after recording is a value equal to or higher than a lower limit value for reproduction.