The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2011

Filed:

Jul. 18, 2006
Applicants:

Mamoru Shoji, Osaka, JP;

Yasumori Hino, Nara, JP;

Harumitsu Miyashita, Nara, JP;

Isao Kobayashi, Osaka, JP;

Inventors:

Mamoru Shoji, Osaka, JP;

Yasumori Hino, Nara, JP;

Harumitsu Miyashita, Nara, JP;

Isao Kobayashi, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/125 (2006.01);
U.S. Cl.
CPC ...
Abstract

A calculation of a reliability value |Pa−Pb|−Pstd, representing represents a maximum likelihood decoding result on a portion which corresponds to a start or termination edge of a recording mark and has a high probability of error occurrence by a maximum likelihood decoding method, is performed on each combination of a predetermined mark length and a space length immediately before the mark and each combination of the mark length and a space length immediately after the mark. Based on the calculation result, a recording parameter is optimized, and recording reflecting the optimized recording parameter is performed.


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