The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
May. 01, 2008
Ulrich Sander, Rebstein, CH;
Ulrich Sander, Rebstein, CH;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
An optical device, in particular a microscope (), that includes a beam path in which is arranged at least one deflection element (to) for deflecting the beam path, at least one vibration sensor () being arranged in or on the optical device; at least one of the deflection elements (to) including a mirror having a controllably deformable mirror surface (); and a control unit () being provided that, as a function of the output signal of the vibration sensor (), applies control to the at least one deflection element (to) in order to adjust the mirror surface () in such a way that vibrations of the optical device are compensated for by a correspondingly opposite-phase adjustment of the mirror surface ().