The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Aug. 31, 2007
Marcus Dyba, Heidelberg, DE;
Marcus Dyba, Heidelberg, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The invention proposes a method for imaging at least one microscopic property of a sample and an apparatus with which the proposed method can be carried out. In the method, at least one coherent illumination light with at least one illumination wavelength is produced by means of at least one light source. The illumination light is imaged onto at least one region on or within the sample. Detection light emitted by the sample is split at least partially into incoherent detection light and into coherent detection light by means of at least on physically separating beam splitter. The coherent detection light is at least partially separated from the coherent illumination light by at least one beam-splitter element. The coherent detection light is detected. The proposed method can be used in particular for investigating the sample by means of coherent anti-Stokes-Raman scattering.