The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Aug. 01, 2005
Ken Tsukii, Tokyo, JP;
Jie Xu, Tokyo, JP;
Kenichi Kimura, Tokyo, JP;
Satoshi Sugiyama, Tokyo, JP;
The Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
A specimen optical information recognizing device includes a specimen containing section containing a specimen to be measured, a specimen measuring section having a light source for outputting light for observing the specimen, a photodetecting section for collecting optical information from the specimen, and an optical waveguide for propagating light between the specimen containing and the specimen measuring sections. The optical information on the specimen may be recognized by measuring values under at least two measurement conditions. The specimen optical information recognizing device includes a measurement auxiliary liquid interposed between the end of the optical waveguide and the specimen. A longitudinal cross section of the specimen containing section may be of a recessed shape, and the aperture depth of the recessed portion may be greater than the aperture diameter. A through hole may be provided at least in a part near the bottom of the specimen containing section.