The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
May. 22, 2008
Liron Nunez Weissman, Tel-Aviv, IL;
Uri Kinrot, Hod Hasharon, IL;
Alex Alon, Binyamina, IL;
Irina Alon, Binyamina, IL;
Liron Nunez Weissman, Tel-Aviv, IL;
Uri Kinrot, Hod Hasharon, IL;
Alex Alon, Binyamina, IL;
Irina Alon, Binyamina, IL;
Tessera Technologies Ltd., San Jose, CA (US);
Abstract
A method for calibration of an imaging device that includes a sensor and optics for forming an image on the sensor. The method includes making a first image quality measurement, based on an output of the sensor, while imaging a first target at a first distance from the device and varying an offset between the optics and the sensor. A second image quality measurement is made while imaging a second target at a second distance from the device, which is different from the first distance, and varying the offset between the optics and the sensor. A working point of the optics is set relative to the sensor responsively to the first and second image quality measurements.