The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2011

Filed:

Nov. 06, 2007
Applicants:

Duncan A. Riach, Mountain View, CA (US);

Leslie E. Neft, Mountain View, CA (US);

Michael A. Ogrinc, San Francisco, CA (US);

Tyvis C. Cheung, Santa Clara, CA (US);

Inventors:

Duncan A. Riach, Mountain View, CA (US);

Leslie E. Neft, Mountain View, CA (US);

Michael A. Ogrinc, San Francisco, CA (US);

Tyvis C. Cheung, Santa Clara, CA (US);

Assignee:

NVDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/14 (2006.01); G06F 13/00 (2006.01); G06T 1/00 (2006.01); G09G 5/39 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the present invention sets forth a system for computing and error checking configuration parameters related to raster image generation within a graphics processing unit. Input parameters are validated by a hardware-based error checking engine. A hardware-based pre-calculation engine uses validated input parameters to compute additional private configuration parameters used by the raster image generation circuitry within a graphics processing unit.


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