The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2011

Filed:

Feb. 01, 2005
Applicants:

Anne Ferreol, Colombes, FR;

Blandine Vibert, Paris, FR;

Philippe Morgand, Athis-Mons, FR;

Inventors:

Anne Ferreol, Colombes, FR;

Blandine Vibert, Paris, FR;

Philippe Morgand, Athis-Mons, FR;

Assignee:

Thales, , FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A goniometry method for one or several diffuse (or distributed) sources is disclosed. The sources or sources having one or more give directions and a diffusion cone. The sources are received by an array of several sensors. The method breaks down the diffusion cone into a finite number L of diffusers. A diffuser has the parameters (θ, δθ, Δ, δΔ), associated with it. Directing vectors a(θ+δθ, Δ+δΔ) associated with the L diffusers are combined to obtain a vector (D(θ, Δ, δθ, δΔ) α or U(θ, Δ) β(δθ, δΔ, α)) dependent on at least one of the incidence and deflection parameters (θ, Δ, δθ, δΔ) and on the combination vector α. A MUSIC-type criterion or other goniometry algorithm is applied to the vectors D(θ, Δ, δθ, δΔ) α or U(θ, Δ) β(δθ, δΔ, α) obtained in order to determine at least one of the incidence parameters θ, Δ, δθ, δΔof the associated diffusion cone.


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