The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Dec. 31, 2007
Robert S. Beach, Los Gatos, CA (US);
Arley C. Marley, San Jose, CA (US);
David J. Seagle, Morgan Hill, CA (US);
Robert S. Beach, Los Gatos, CA (US);
Arley C. Marley, San Jose, CA (US);
David J. Seagle, Morgan Hill, CA (US);
Hitachi Global Storage Technologies, Netherlands B.V., Amsterdam, NL;
Abstract
A wafer comprises a kerf region and a test chip. The kerf is a region in a wafer designated to be destroyed by chip dicing. The test chip is located within the kerf region and is configured to provide parametric data for a wafer fabrication process of a head. The test chip comprises a shield portion of a first shield layer electrically coupled to an element, a first pad within a second shield layer electrically coupled to the element, and a second pad within the second shield layer electrically coupled to the shield portion.