The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Oct. 26, 2006
Applicants:
Toshihiro Sugiura, Aichi, JP;
Masamune Takeda, Aichi, JP;
Junichi Takahashi, Aichi, JP;
Inventors:
Assignee:
Masprodenkoh Kabushikikaisha, Aichi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); H01Q 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An interference exclusion capability testing apparatus is provided for use in testing interference exclusion capability of a specimen by radiating an electromagnetic wave toward the specimen from a radiating antenna. The radiating antenna includes an electromagnetic horn, and a waveguide plate that guides an electromagnetic wave radiated from the electromagnetic horn to the specimen.