The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Jul. 16, 2007
Applicants:
Ralf Wolleschensky, Jena, DE;
Mirko Liedtke, Jena, DE;
Inventors:
Ralf Wolleschensky, Jena, DE;
Mirko Liedtke, Jena, DE;
Assignee:
Carl Zeiss MicroImaging GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
An arrangement for signal processing at the output of a multichannel detector in the spectrally resolved acquisition of time-variable fluorescence phenomena in a microscope, particularly lifetime measurements, is characterized in that an FPGA (free programmable gate array) is arranged downstream of the output of the multichannel detector.