The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2011

Filed:

Jun. 27, 2008
Applicants:

Sung Chul Kang, Seoul, KR;

Hyouk Ryeol Choi, Gyeonggi-do, KR;

Inventors:

Sung Chul Kang, Seoul, KR;

Hyouk Ryeol Choi, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A texture measuring apparatus that measures surface information of an object includes: a probe coming into contact with the object while moving on a surface of the object; a first sensor unit, provided at the probe, for detecting a force acting on the probe in a direction perpendicular to a lengthwise direction of the probe; and a second sensor unit, provided at the rear of the probe, for detecting a force acting on the probe in the lengthwise direction of the probe. The apparatus further includes a third sensor unit, provided between the first sensor unit and the second sensor unit, for detecting variations in the forces acting on the probe.


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