The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Sep. 26, 2008
Jodi M. Mecca, Midland, MI (US);
John Keith Harris, Midland, MI (US);
Irina V. Graf, Midland, MI (US);
Eric Robert Traub, Saginaw, MI (US);
Paul L. Morabito, Midland, MI (US);
Linda A. Moore, Midland, MI (US);
Jodi M. Mecca, Midland, MI (US);
John Keith Harris, Midland, MI (US);
Irina V. Graf, Midland, MI (US);
Eric Robert Traub, Saginaw, MI (US);
Paul L. Morabito, Midland, MI (US);
Linda A. Moore, Midland, MI (US);
Dow Global Technologies LLC, Midland, MI (US);
Abstract
The invention provides, in one embodiment, a device for performing scrub testing on a plurality of samples simultaneously, including a plurality of scrubbing devices. A stage is provided which positions the plurality of samples in contact with the plurality of scrubbing devices. The scrubbing devices can individually be provided with different weights to produce different forces on the samples. A motion producing device produces one or both of linear and rotational motion between the brushes and the samples. The scrubbing devices are held in the stage so as move freely vertically.