The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Mar. 05, 2008
Applicants:

Tobias Gemmeke, Stutensee, DE;

Christoph Jaeschke, Tuebingen, DE;

Jens Kuenzer, Boeblingen, DE;

Cedric Lichtenau, Stuttgart, DE;

Thomas Pflueger, Leinfelden, DE;

Jochen Preiss, Boeblingen, DE;

Inventors:

Tobias Gemmeke, Stutensee, DE;

Christoph Jaeschke, Tuebingen, DE;

Jens Kuenzer, Boeblingen, DE;

Cedric Lichtenau, Stuttgart, DE;

Thomas Pflueger, Leinfelden, DE;

Jochen Preiss, Boeblingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor chip subdivided into power domains, at least one of the power domains is separately activated or deactivated and at least a part of the scannable storage elements are interconnected to one or more scan chains. At least one scan chain is serially subdivided into scan chain portions and the scan chain portion is arranged within one of the power domains. For at least one scan chain portion a bypass line is provided for passing by scan data and at least one select unit is provided for selecting between the bypass line and the corresponding scan chain portion in dependence of the activated or deactivated state of the corresponding power domains.


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