The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Apr. 25, 2007
Dheemanth Nagaraj, Longmont, CO (US);
Larry J. Thayer, Ft. Collins, CO (US);
Dheemanth Nagaraj, Longmont, CO (US);
Larry J. Thayer, Ft. Collins, CO (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method is provided for managing defects in a semiconductor memory system having a plurality of addressable locations. In the method, a first plurality of the addressable locations is allocated as in-use locations, and a second plurality of the addressable locations is allocated as spare locations. A plurality of sets of the in-use locations, wherein each of the sets is associated with a memory defect, is determined. At least one of the sets includes a different number of in-use locations than another of the sets. Each of the sets of the in-use locations is associated with at least one corresponding set of the spare locations. Each of a plurality of data requests that is associated with one of the sets of the in-use locations is directed to the at least one corresponding set of the spare locations.