The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Apr. 29, 2008
Applicants:

Steven Wayne O'neal, Bartonville, IL (US);

Mark Ryan Hazen, Bloomington, IL (US);

Todd Philip Cole, Washington, IL (US);

David Charles Janik, Normal, IL (US);

Joseph Anthony Lang, Edwards, IL (US);

Inventors:

Steven Wayne O'Neal, Bartonville, IL (US);

Mark Ryan Hazen, Bloomington, IL (US);

Todd Philip Cole, Washington, IL (US);

David Charles Janik, Normal, IL (US);

Joseph Anthony Lang, Edwards, IL (US);

Assignee:

Caterpillar Inc., Peoria, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A machine data acquisition system is disclosed. The data acquisition system may include a sensor disposed on a machine and configured to produce a signal indicative of an operational parameter of the machine. The system may also include a data processor and controller configured to convert the signal into a plurality of parameter data points. The system may further include a primary data circular buffer disposed on the machine and configured to store the plurality of parameter data points. Additionally, a variable resolution circular buffer may be disposed on the machine and configured to store a compressed parameter data point calculated from the plurality of parameter data points.


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