The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Jun. 25, 2008
Vladimir Kozitsky, Rochester, NY (US);
Aaron Michael Burry, Ontario, NY (US);
Alex Scott Brougham, Webster, NY (US);
Vladimir Kozitsky, Rochester, NY (US);
Aaron Michael Burry, Ontario, NY (US);
Alex Scott Brougham, Webster, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A system and method for measuring a substrate edge signal for image sensor phasing. An intermediate transfer substrate edge signal can be effectively mapped by a substrate edge sensor and recorded for at least one complete revolution. A substrate edge signal from an inter-document zone sampled from any region of a substrate in runtime by a process sensor can also be recorded. A comparison or cross-correlation can be applied between the bare intermediate transfer substrate edge signal and the substrate edge signal sensed in the inter-document zone. A cross-correlation algorithm returns a maximum peak value when the two signals are registered in-phase with one another. This information can then be used to register the bare belt process sensor signal and the process sensor signal over the region of interest in-phase with one another. A flat-fielding algorithm can also be applied to the phase-aligned process sensor data to remove artifacts and compensate for substrate (e.g., belt) induced non-uniformities.